๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Quantitative analysis of boron profiles in silicon using ion microprobe mass spectrometry

โœ Scribed by M. Croset


Book ID
112766513
Publisher
Springer
Year
1972
Tongue
English
Weight
280 KB
Volume
12
Category
Article
ISSN
1588-2780

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


Quantitative secondary ion mass spectrom
โœ Yamazaki, Hideyuki; Takahashi, Mamoru ๐Ÿ“‚ Article ๐Ÿ“… 1997 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 262 KB ๐Ÿ‘ 2 views

Quantitative analysis of the native oxide on silicon wafers has been investigated by secondary ion mass spectrometry (SIMS) combined with an encapsulation method. In the encapsulation technique, the sample surface is covered with a thin รlm whose material is identical to that of the substrate of the

Quantitative analysis of pethidine using
โœ Fengrui Song; Meng Cui; Shuying Liu ๐Ÿ“‚ Article ๐Ÿ“… 1999 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 43 KB ๐Ÿ‘ 2 views

A method for the quantatitive determination of pethidine in human urine by liquid secondary ion and tandem mass spectrometry is presented. Quantification was carried out by using ketamine as internal standard. It was found that the collision-induced dissociation (CID) spectrum of the [M H] ion of pe