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Quantification of trap densities at dielectric/III–V semiconductor interfaces

✍ Scribed by Engel-Herbert, Roman; Hwang, Yoontae; Stemmer, Susanne

Book ID: 118234721
Publisher: American Institute of Physics
Year: 2010
Tongue: English
Weight: 832 KB
Volume: 97
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.3479047

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