๐”– Bobbio Scriptorium
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Quantification of surface hydroxides using chemical labeling and XPS

โœ Scribed by Tuan A. Dang; R. Gnanasekaran; Denise D. Deppe

Publisher
John Wiley and Sons
Year
1992
Tongue
English
Weight
447 KB
Volume
18
Category
Article
ISSN
0142-2421

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โœฆ Synopsis

Abstract

XPS when used in conjunction with silylation can determine surface hydroxide. The penetration depth was studied using DRIFT and various silylation conditions. Application of this technique to many different inorganic matrices, including Si~3~N~4~, glass, silica thin film, zinc silicate lamp phosphor and Al~2~O~3~, is illustrated.

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