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Quantification of amorphous SiC: H films using XPS and AES with three standards

โœ Scribed by A. G. Fitzgerald; A. E. Henderson; S. E. Hicks; P. A. Moir; B. E. Storey


Publisher
John Wiley and Sons
Year
1989
Tongue
English
Weight
456 KB
Volume
14
Category
Article
ISSN
0142-2421

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