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Qualification of OMVPE AlGaAs/GaAs HBT structures using nondestructive photoreflectance spectroscopy

✍ Scribed by N. Bottka; D.K. Gaskill; P.D. Wright; R.W. Kaliski; D.A. Williams

Publisher: Elsevier Science
Year: 1991
Tongue: English
Weight: 364 KB
Volume: 107
Category: Article
ISSN: 0022-0248
DOI: 10.1016/0022-0248(91)90576-q

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