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Pulsed ESR Studies on Doped Microcrystalline Silicon

✍ Scribed by C. Malten; J. Müller; F. Finger

Publisher: John Wiley and Sons
Year: 1997
Tongue: English
Weight: 136 KB
Volume: 201
Category: Article
ISSN: 0370-1972
DOI: 10.1002/1521-3951(199706)201:2<r15::aid-pssb999915>3.0.co;2-3

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P.O. Box 513, NL-5600 MB, Eindhoven (The Netherlands) [\*\*] The authors thank Semjon Shikin (NT-MDT, Moscow, Russia) for his help with the modulated friction force imaging and Alexander Alexeev and Dmitri Kozodaev for their valuable support and discussions. The Dutch Polymer Institute (DPI), Fundam