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Pull-In Phenomenon Investigation of Nanoelectromechanical Systems

✍ Scribed by Sadeghian, H; Rezazadeh, Gh; Malekpour, Ehsan


Book ID
120710825
Publisher
Institute of Physics
Year
2006
Tongue
English
Weight
119 KB
Volume
34
Category
Article
ISSN
1742-6588

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We analyze the shot noise of a spin-degenerate electronic level coupled to an harmonic oscillator in the presence of relaxation. We show that the electromechanical coupling can induce a suppression of the Fano factor below the value expected without phonons F ΒΌ 5 9 . Moreover, in the presence of fin