Berührungslose Prüfung von Kunststoffen
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Prof. Dr.-Ing. P. Eyerer; Dr. rer. nat. G. Busse
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Article
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1984
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John Wiley and Sons
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English
⚖ 918 KB
voltage for measuring low concentrations in electron microprobe analysis, BEDO 6 (1973) 13-18. 34. L. Albert, How thin layers and how low localized masses can be detected by means of electron probe microanalysis? -A theoretical investigation, BEDO 6 (1973) 19-42.