Proton radiation effects in 0.35-μm partially depleted SOI MOSFETs fabricated on UNIBOND

✍ Scribed by Li, Y.; Niu, G.; Cressler, J.D.; Patel, J.; Marshall, P.W.; Kim, H.S.; Liu, M.S.T.; Reed, R.A.; Palmer, M.J.

• Book ID: 111863911
• Publisher: IEEE
• Year: 2002
• Tongue: English
• Weight: 386 KB
• Volume: 49
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/tns.2002.805428