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Properties of Liquid Silicon Observed by Time-Resolved X-Ray Absorption Spectroscopy

✍ Scribed by Johnson, S. L.; Heimann, P. A.; Lindenberg, A. M.; Jeschke, H. O.; Garcia, M. E.; Chang, Z.; Lee, R. W.; Rehr, J. J.; Falcone, R. W.

Book ID: 124095378
Publisher: The American Physical Society
Year: 2003
Tongue: English
Weight: 118 KB
Volume: 91
Category: Article
ISSN: 0031-9007
DOI: 10.1103/PhysRevLett.91.157403

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