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Photostriction effect in silicon observed by time-resolved x-ray diffraction

✍ Scribed by John R. Buschert; R. Colella


Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
358 KB
Volume
80
Category
Article
ISSN
0038-1098

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Novel sample preparation and data reduction techniques were used to determine quantitative phase abundances from in situ timeresolved X-ray diffraction data and to follow the rate of solidstate reactions. This is illustrated by a study of the formation of \(\mathrm{YBa}_{2} \mathrm{Cu}_{3} \mathrm{O