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Properties of Au, Pt, Pd and Rh levels in silicon measured with a constant capacitance technique

✍ Scribed by J.A. Pals

Publisher: Elsevier Science
Year: 1974
Tongue: English
Weight: 438 KB
Volume: 17
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(74)90157-9

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📜 SIMILAR VOLUMES

Properties of Au, Pt, Pd and Rh levels i

Properties of Au, Pt, Pd and Rh levels in silicon measured with a constant capacitance technique : J. A. Pals. Solid State Electron.17, 1139 (1974)

📂 Article 📅 1975 🏛 Elsevier Science 🌐 English ⚖ 134 KB