Properties of Au, Pt, Pd and Rh levels in silicon measured with a constant capacitance technique : J. A. Pals. Solid State Electron.17, 1139 (1974)

• Publisher: Elsevier Science
• Year: 1975
• Tongue: English
• Weight: 134 KB
• Volume: 14
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(75)90641-1