𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Properties of a-C/B : H films relevant to plasma—surface interactions

✍ Scribed by J. Von Seggern; P. Wienhold; H.G. Esser; J. Winter; A. Gorodetsky; S. Grashin; I. Gudowska; G.G. Ross

Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
526 KB
Volume
176-177
Category
Article
ISSN
0022-3115

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Surface morphology and electrical transp
Surface morphology and electrical transport properties of YBa2Cu3O7 films on substrates relevant for technical application
✍ G. Adrian; G. Grabe; W. Wilkens; H. Adrian; M. Huth; A. Walkenhorst 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 413 KB

YBa2CuaOr films depositea on AlcOa by laser ablation show c-axis oriented growth and critical temperatures T~ as high as 90 K. However the critical curren ~. density J~ is comparatively low. An improvement was achieved by using a ZrO2 intermediate layer which acts as a diffusion harrier. Bilayer YBa

Properties of evaporated metal films rel
Properties of evaporated metal films related to their use for surface temperature measurements
✍ Theodore B. Simpson; Charles C. Winding 📂 Article 📅 1956 🏛 American Institute of Chemical Engineers 🌐 English ⚖ 641 KB

## Abstract Extension of the understanding of properties of films of metals produced on glass surfaces by vacuum evaporation has permitted the fabrication of film‐resistance thermometers that with simple instrumentation accurately measure surface or average surface temperatures without altering the

Surface studies of SiC/SiCf composites e
Surface studies of SiC/SiCf composites exposed to relevant fusion reactor conditions
✍ L. C. Alves; A. Paúl; E. Alves; M. F. da Silva; J. C. Soares; L. Rebouta; A. La 📂 Article 📅 2000 🏛 John Wiley and Sons 🌐 English ⚖ 237 KB

SiC/SiC f ceramic composites are interesting materials for applications in fusion technology due to their high performance and low activation characteristics. Combining microbeam RBS and proton-induced x-ray emission (PIXE) with XPS and x-ray diffraction techniques, we study the structural changes t