𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Properties and anodization of evaporated aluminum films studied by ellipsometry

✍ Scribed by Conrad J. Dell'oca


Publisher
Elsevier Science
Year
1975
Tongue
English
Weight
671 KB
Volume
26
Category
Article
ISSN
0040-6090

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Characterization of Vacuum Evaporated Po
✍ M. Sridharan; Sa. K. Narayandass; D. Mangalaraj; H. C. Lee πŸ“‚ Article πŸ“… 2002 πŸ› John Wiley and Sons 🌐 English βš– 376 KB πŸ‘ 1 views

Cd 0.96 Zn 0.04 Te thin films are deposited onto well cleaned glass substrates (Corning 7059) kept at room temperature by vacuum evaporation and the films are annealed at 423 K. Rutherford Backscattering Spectrometry and X-ray diffraction techniques are used to determine the thickness, composition a

Study of Optical, Morphological and Stru
✍ L.M. Caicedo; G. Cediel; A. Dussan; J.W. Sandino; C. CalderΓ³n; G. Gordillo πŸ“‚ Article πŸ“… 2000 πŸ› John Wiley and Sons 🌐 English βš– 125 KB πŸ‘ 2 views

A parameter set was found which allows depositing ZnSe thin films with good properties to be used as buffer layer in solar cells with ZnO/ZnSe/CIGS structure. In this way, the ZnSe compound could be used in substitution of the CdS which is a toxic material generally used as buffer layer in Cu(In,Ga)