Determination of Group III Nitride Film Properties by Reflectance and Spectroscopic Ellipsometry Studies

✍ Scribed by Goldhahn, R. ;Shokhovets, S. ;Scheiner, J. ;Gobsch, G. ;Cheng, T.S. ;Foxon, C.T. ;Kaiser, U. ;Kipshidze, G.D. ;Richter, W.

• Publisher: John Wiley and Sons
• Year: 2000
• Tongue: English
• Weight: 291 KB
• Volume: 177
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/(sici)1521-396x(200001)177:1<107::aid-pssa107>3.0.co;2-8