Dielectric Properties of Ti, TiO2 and TiN from 1.5 to 60 eV Determined by Reflection Electron Energy Loss Spectroscopy (REELS) and Ellipsometry

✍ Scribed by Fuentes, G. G. ;Mancheño, I. G. ;Balbás, F. ;Quirós, C. ;Trigo, J. F. ;Yubero, F. ;Elizalde, E. ;Sanz, J. M.

• Publisher: John Wiley and Sons
• Year: 1999
• Tongue: English
• Weight: 182 KB
• Volume: 175
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/(sici)1521-396x(199909)175:1<429::aid-pssa429>3.0.co;2-6