## Abstract The present paper computes the normalized phase constant, dielectric loss, and conductor loss of the voltage‐controlled Schottky‐contact microstrip line using the variational method based on the single‐layer reduction (SLR) formulation. Results computed by the SLR formulation show very
Propagation characteristics of suspended MIS coupled slow-wave microstrip lines
✍ Scribed by A. K. Verma; Nasimuddin; Enakshi K. Sharma
- Publisher
- John Wiley and Sons
- Year
- 2002
- Tongue
- English
- Weight
- 120 KB
- Volume
- 34
- Category
- Article
- ISSN
- 0895-2477
No coin nor oath required. For personal study only.
✦ Synopsis
Abstract
The single‐layer reduction (SLR) formulation is presented to compute the propagation characteristics, that is, the slowing factor (normalized phase constant) and the attenuation constant of the even and odd modes of the suspended MIS coupled slow‐wave microstrip lines. The proposed structure is suitable for the design of a compact high‐directivity coupler. For the standard coupled MIS microstrip line the SLR computes the slowing factor with deviation about 1% and the attenuation constant with 0.005 dB/mm difference against reults of the spectral domain analysis (SDA). The SLR is as accurate as the SDA; however, computationally it is much faster than the SDA. © 2002 Wiley Periodicals, Inc. Microwave Opt Technol Lett 34: 403–405, 2002; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.10476
📜 SIMILAR VOLUMES
## Abstract Guided‐wave characteristics of planar periodic microstrip lines with inductive loading are investigated by resorting to the unit‐length transmission parameters of an equivalent transmission line. By applying the SOC de‐embedding technique, the above two quantities are effectively extrac
## Abstract The attenuation and slow‐wave characteristics in an inverted embedded metal‐insulator‐semiconductor (IEM‐MIS) microstrip line are investigated in this paper, based on the extracted frequency‐dependent distributed parameters, that is, per‐unit‐length series resistance and inductance, shu