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Propagation characteristics of Schottky-contact slow-wave microstrip line

✍ Scribed by A. K. Verma; Nasimuddin

Publisher
John Wiley and Sons
Year
2001
Tongue
English
Weight
155 KB
Volume
29
Category
Article
ISSN
0895-2477

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✦ Synopsis

Abstract

The present paper computes the normalized phase constant, dielectric loss, and conductor loss of the voltage‐controlled Schottky‐contact microstrip line using the variational method based on the single‐layer reduction (SLR) formulation. Results computed by the SLR formulation show very good agreement with the experimental results, both in the normalized phase constant and total losses with 2.0% and 0.01 dB/mm, respectively. The present formulation can also handle a greater number of dielectric layers. The model is suitable for the CAD of Schottky‐contact microstrip structures. © 2001 John Wiley & Sons, Inc. Microwave Opt Technol Lett 29: 341–344, 2001.

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