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Progressive module redundancy for fault-tolerant designs in nanoelectronics

✍ Scribed by Tian Ban; Lirida Naviner

Book ID: 113800501
Publisher: Elsevier Science
Year: 2011
Tongue: English
Weight: 321 KB
Volume: 51
Category: Article
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2011.06.020

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