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Progress on Johnson noise thermometry using a quantum voltage noise source for calibration

✍ Scribed by Sae Woo Nam; Benz, S.P.; Dresselhaus, P.D.; Burroughs, C.J., Jr.; Tew, W.L.; White, D.R.; Martinis, J.M.

Book ID: 111652273
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 139 KB
Volume: 54
Category: Article
ISSN: 0018-9456
DOI: 10.1109/tim.2005.843574

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