Johnson noise thermometry measurements using a quantized voltage noise source for calibration

✍ Scribed by Sae Woo Nam; Benz, S.P.; Dresselhaus, P.D.; Tew, W.L.; White, D.R.; Martinis, J.M.

• Book ID: 111652271
• Publisher: IEEE
• Year: 2003
• Tongue: English
• Weight: 340 KB
• Volume: 52
• Category: Article
• ISSN: 0018-9456
• DOI: 10.1109/tim.2003.811686