Progress in the field of Kossel and pseudo-Kossel technique
✍ Scribed by Ullrich, Hans -J�rgen
- Publisher
- Springer-Verlag
- Year
- 1990
- Weight
- 403 KB
- Volume
- 101
- Category
- Article
- ISSN
- 0344-838X
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## Abstract There are world‐wide efforts to analyse micron regions of compact samples by means of X‐ray diffraction (“X‐ray Microdiffraction”). Two micro diffraction procedures, the KOSSEL technique excited by electron or synchrotron radiation beams and the new X‐ray Rotation‐Tilt Method (XRT), are
tion, indicating that more ordered particle structuring occurs A nondestructive Kossel diffraction technique based on the prininside colloidal dispersions. More detailed investigations ciple of back-light scattering was used to characterize the structure were made by several other groups through ana