Progress in Nanoscale Characterization and Manipulation

✍ Scribed by Rongming Wang, Chen Wang, Hongzhou Zhang, Jing Tao, Xuedong Bai

Publisher: Springer Singapore
Year: 2018
Tongue: English
Leaves: 511
Series: Springer Tracts in Modern Physics 272
Edition: 1st ed.
Category: Library

No coin nor oath required. For personal study only.

✦ Synopsis

This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research.
The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.

✦ Table of Contents

Front Matter ....Pages i-vii
Electron/Ion Optics (Jing Tao, Rongming Wang, Hongzhou Zhang)....Pages 1-33
Scanning Electron Microscopy (Wei Han, Huisheng Jiao, Daniel Fox)....Pages 35-68
Transmission Electron Microscopy (Rongming Wang, Jing Tao, Kui Du, Yumei Wang, Binghui Ge, Fanghua Li et al.)....Pages 69-203
Scanning Transmission Electron Microscopy (STEM) (Binghui Ge)....Pages 205-254
Spectroscopy (Zhihua Zhang, Yonghai Yue, Jiaqing He)....Pages 255-299
Aberration Corrected Transmission Electron Microscopy and Its Applications (Lin Gu)....Pages 301-379
In Situ TEM: Theory and Applications (Kun Zheng, Yihua Gao, Xuedong Bai, Renchao Che, Ze Zhang, Xiaodong Han et al.)....Pages 381-477
Helium Ion Microscopy (Daniel Fox, Hongzhou Zhang)....Pages 479-508

✦ Subjects

Physics; Nanoscale Science and Technology; Characterization and Evaluation of Materials; Spectroscopy and Microscopy

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