Nanoscale Characterization of Surfaces and Interfaces

✍ Scribed by N. John DiNardo, N. J. DiNardo

• Publisher: Wiley-VCH
• Year: 1994
• Tongue: English
• Leaves: 177
• Edition: 1
• Category: Library

✦ Synopsis

Derived from the highly acclaimed series Materials Science and Technology, this book provides in-depth coverage of STM, AFM, and related non-contact nanoscale probes along with detailed applications, such as the manipulation of atoms and clusters on a nanometer scale. The methods are described in terms of the physics and the technology of the methods and many high-quality images demonstrate the power of these techniques in the investigation of surfaces and the processes which occur on them.

Topics include:
Semiconductor Surfaces and Interfaces * Insulators * Layered Compounds * Charge Density Wave Systems * Superconductors * Electrochemisty at Liquid-Solid Interfaces * Biological Systems * Metrological Applications * Nanoscale Surface Forces * Nanotribology * Manipulation on the Nanoscale

Materials scientists, surface scientists, electrochemists, as well as scientists working in catalysis and microelectronics will find this book an invaluable source of information

✦ Table of Contents

Nanoscale Characterization of Surfaces and Interfaces
Nanoscale Characterization of Surfaces and Interfaces
List of Symbols and Abbreviations
1 Introduction
2 Scanning Tunneling Microscopy (STM)
2.1 Historical Perspective
2.2 Theory
2.2.1 Electron Tunneling and STM Imaging
2.2.2 Scanning Tunneling Spectroscopy (STS)
2.2.3 Inelastic Tunneling Spectroscopy
2.2.4 Ballistic Electron Emission Microscopy (BEEM)
2.3 Instrumentation
2.3.1 Microscope Design: STM Heads
2.3.2 Tips
2.3.3 Vibration and Shock Isolation
2.3.4 Electronics
2.3.5 Microcomputer Control
2.4 Semiconductor Surfaces
2.4.1 Si(111)
2.4.2 Si(100)
2.4.3 GaAs(110)
2.4.4 Photoinduced Processes
2.5 Metal–Semiconductor Interfaces
2.5.1 Alkali­Metal–Semiconductor Interfaces
2.5.2 Growth of Trivalent Metals on Si(001)
2.5.3 Ambiguities in Structural Determinations
2.5.4 Electron Localization at Defects in Epitaxial Layers
2.5.5 EF Pinning, Mid-Gap States, and Metallization
2.5.6 The Insulator – Metal Transition in Metallic Fe Clusters Grown on Semiconductor Surfaces
2.5.7 Microscopy and Spectroscopy of Buried Interfaces – BEEM
2.6 Metal Surfaces
2.6.1 Close-Packed Surfaces
2.6.2 Surface Diffusion
2.6.3 Stepped Surfaces
2.6.4 Adsorbate-Induced Reconstructions of Metal Surfaces
2.6.5 Growth of Metallic Adlayers
2.6.6 Resistivity in Polycrystalline Metals – Scanning Tunneling Potentiometry
2.7 Insulators
2.8 Layered Compounds
2.9 Charge Density Wave Systems
2.10 Superconductors
2.11 Molecular Films, Adsorbates, and Surface Chemistry
2.11.1 Molecular Imaging
2.11.2 Adsorption and Surface Chemistry
2.12 Electrochemistry at Liquid–Solid Interfaces
2.1 3 Biological Systems
2.14 Metrological Applications
3 Atomic Force Microscopy
3.1 Atomic Force Imaging
3.1.1 Graphite
3.1.2 Insulators
3.1.3 Metals
3.1.4 Films
3.1.5 Polymer Surfaces and Metal Films on Polymer Substrates
3.1.6 Biological Molecules
3.1.7 Adsorption Dynamics of Biological Molecules in Real Time
3.2 Nanoscale Surface Forces
3.3 Nanotribology
3.4 Non-Contact Imaging
3.4.1 Van der Waals Forces
3.4.2 Electrostatic Forces
3.4.3 Magnetic Forces
4 Manipulation of Atoms and Atom Clusters on the Nanoscale
4.1 Transfer of Atoms and Atom Clusters Between Tip and Sample
4.2 Tip-Induced Lateral Motion of Atoms on Surfaces
4.3 Nanoscale Modification by Tip-Induced Local Electron-Stimulated Desorption
4.4 Nanoscale Chemical Modification
4.5 High-Temperature Nanofabrication
4.6 Nanoscale Surface Modification Using the AFM
4.7 Towards Nanoscale Devices
5 Spin-offs of STM - Non-Contact Nanoscale Probes
5.1 Scanning Near-Field Optical Microscope (SNOM)
5.2 Photon Scanning Tunneling Microscope (PSTM)
5.3 Scanning Thermal Profiler (STP)
5.4 Scanning Chemical Potential Microscope (SCPM)
5.5 Optical Absorption Microscope (OAM)
5.6 Scanning Ion Conductance Microscope (SICM)
6 Acknowledgements
7 References
Index