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Programmable built-in self-testing of embedded RAM clusters in system-on-chip architectures

โœ Scribed by Benso, A.; Di Carlo, S.; Di Natale, G.; Prinetto, P.; Bodoni, M.L.


Book ID
117892136
Publisher
IEEE
Year
2003
Tongue
English
Weight
550 KB
Volume
41
Category
Article
ISSN
0163-6804

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