Profiling of the dielectric function across Al/SiO2/Si heterostructures with electron energy loss spectroscopy

✍ Scribed by Marek A. Turowski; Thomas F. Kelly

• Publisher: Elsevier Science
• Year: 1992
• Tongue: English
• Weight: 647 KB
• Volume: 41
• Category: Article
• ISSN: 0304-3991
• DOI: 10.1016/0304-3991(92)90093-y