Profiling generation lifetime in an MOS capacitor using a multistep constant-capacitance technique

✍ Scribed by R. Lal; J. Vasi

• Book ID: 107856836
• Publisher: Elsevier Science
• Year: 1987
• Tongue: English
• Weight: 356 KB
• Volume: 30
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(87)90004-9