Profiling generation lifetime in an MOS capacitor using a multistep constant-capacitance technique : R. Lal and J. Vasi. Solid-St. Electron.30, 801 (1987)

• Book ID: 103282252
• Publisher: Elsevier Science
• Year: 1988
• Tongue: English
• Weight: 93 KB
• Volume: 28
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(88)90157-6