๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Profile analysis application in the modelling of multiwave diffraction

โœ Scribed by Nesterenko, A. P. ;Zhukov, S. G. ;Fetisov, G. V. ;Aslanov, L. A.

Book ID
114500506
Publisher
International Union of Crystallography
Year
1991
Tongue
English
Weight
293 KB
Volume
24
Category
Article
ISSN
0021-8898

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Analysis of broadened X-ray diffraction
Analysis of broadened X-ray diffraction profiles: Application to the characterization of carbon steels
โœ N. Ji; J.L. Lebrun; J.M. Sprauel ๐Ÿ“‚ Article ๐Ÿ“… 1990 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 544 KB

On the basis of the principle of Warren-Averbach X-ray diffraction profile analysis, an accurate and rapid method of broadened X-ray diffraction profile analysis characterized by the use of a Voigtlike function for profile fitting and by a new modellization of the real part of the Fourier coefficien