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Product-oriented test-pattern generation for Programmable Logic Arrays

✍ Scribed by Jintao Li; Yinghua Min


Book ID
112947417
Publisher
Springer
Year
1990
Tongue
English
Weight
611 KB
Volume
5
Category
Article
ISSN
1000-9000

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BIST-oriented test pattern generator for
✍ Takeshi Asakawa; Kazuhiko Iwasaki; Seiji Kajihara πŸ“‚ Article πŸ“… 2003 πŸ› John Wiley and Sons 🌐 English βš– 999 KB

## Abstract As a technique for complementing the long testing time, which is a shortcoming of pseudo‐random pattern test, we will propose a BIST‐oriented test pattern generator (TPG) which achieves high fault detection efficiency with a short testing time for transition faults. The proposed TPG is