An experimental set-up based on multiwavelength interferometry, is applied in order to study in-situ the dissolution process of thin resist films. The interference function was the basis for a fitting algorithm, which analyses the experimental data and evaluates the progress of the resist thickness
โฆ LIBER โฆ
Processing effects on the dissolution properties of thin chemically amplified photoresist films
โ Scribed by D. Drygiannakis; I. Raptis; G.P. Patsis; A. Boudouvis; K. vanWerden
- Publisher
- Elsevier Science
- Year
- 2008
- Tongue
- English
- Weight
- 155 KB
- Volume
- 85
- Category
- Article
- ISSN
- 0167-9317
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Thin films become an important technology because of its outstanding performance in wide engineering applications. The basic of thin film technology is to characterize its mechanical properties, which are strongly dependent on the internal stresses induced by deposition processes. Therefore, an inve