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Process variation effects on circuit performance: TCAD simulation of 256-Mbit technology [DRAMs]

✍ Scribed by Murthy, C.S.; Gall, M.

Book ID: 119778261
Publisher: IEEE
Year: 1997
Tongue: English
Weight: 264 KB
Volume: 16
Category: Article
ISSN: 0278-0070
DOI: 10.1109/43.663828

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