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[IEEE 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Xian, China (2012.10.29-2012.11.1)] 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology - On the modeling of process variations and its applications for circuit performance designs

✍ Scribed by Ma, James; Yang, Wenwei; Yang, Lianfeng; Wu, Lifeng; Liu, Zhihong

Book ID: 120997104
Publisher: IEEE
Year: 2012
Weight: 319 KB
Category: Article
ISBN: 1467324736
DOI: 10.1109/ICSICT.2012.6467638

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