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[IEEE 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Xian, China (2012.10.29-2012.11.1)] 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology - Multi-level reliability simulation for IC design

✍ Scribed by Sutaria, Ketul; Velamala, Jyothi; Cao, Yu

Book ID: 120258235
Publisher: IEEE
Year: 2012
Weight: 346 KB
Category: Article
ISBN: 1467324736
DOI: 10.1109/ICSICT.2012.6467818

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