✦ LIBER ✦

Process Deviations and Spot Defects: Two Aspects of Test and Test Development for Mixed-Signal Circuits

✍ Scribed by Carsten Wegener; Michael Peter Kennedy; Bernd Straube

Book ID: 110315776
Publisher: Springer US
Year: 2001
Tongue: English
Weight: 191 KB
Volume: 17
Category: Article
ISSN: 0923-8174
DOI: 10.1023/a:1012703202816

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Generation and Verification of Tests for

Generation and Verification of Tests for Analog Circuits Subject to Process Parameter Deviations

✍ S.J. Spinks; C.D. Chalk; I.M. Bell; M. Zwolinski 📂 Article 📅 2004 🏛 Springer US 🌐 English ⚖ 201 KB

Analog signal generation for built-in se

Analog signal generation for built-in self-test of mixed-signal integrated circuits: G.W. Roberts and A. K. Lu, Kluwer Academic Publishers, Norwell, MA, 1995, 120 pp., US$75.00, £52.50, Dfl. 145.00

✍ S.L. Hurst 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 152 KB

The authors of the individual chapters are from academia and from fbur European commercial companies with speci~dist knowledge of this area, with the Editor maintaining a high standard of presentation, both in the written material and in the supporting figures. Unlike some multi-author texts, this b