๐”– Bobbio Scriptorium
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Process capability analysis chart with the application of C pm

โœ Scribed by Chen, K. S.; Huang, M. L.; Hung, Y. H.

Book ID
125810278
Publisher
Taylor and Francis Group
Year
2008
Tongue
English
Weight
636 KB
Volume
46
Category
Article
ISSN
0020-7543

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The conventional Shewhart X chart is developed based on the assumption that the within-sample variation is due to the inherent process variation, and any significant variation between samples is attributed to the existence of assignable causes. In the manufacturing industry there are processes where