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Testing process capability based on C pm in the presence of random measurement errors

✍ Scribed by Pearn, W. L.; Shu, M. H.; Hsu, B. M.

Book ID: 126764346
Publisher: Taylor and Francis Group
Year: 2005
Tongue: English
Weight: 444 KB
Volume: 32
Category: Article
ISSN: 0266-4763
DOI: 10.1080/02664760500164951

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