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Proceedings of the 7th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors: Firenze, Italy, October 5–7, 2005

Book ID: 118492070
Publisher: Elsevier Science
Year: 2007
Tongue: English
Weight: 494 KB
Volume: 570
Category: Article
ISSN: 0168-9002
DOI: 10.1016/j.nima.2006.09.066

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