Proceedings of the 8th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors: Firenze, Italy, June 27–29, 2007

• Publisher: Elsevier Science
• Year: 2008
• Tongue: English
• Weight: 166 KB
• Volume: 596
• Category: Article
• ISSN: 0168-9002
• DOI: 10.1016/j.nima.2008.07.048