Procedures in scanning probe microscopies

Advances in Scanning Probe Microscopy

✍ Naruo Sasaki, Masaru Tsukada (auth.), Professor Toshio Sakurai, Professor Yousuk 📂 Library 📅 2000 🏛 Springer-Verlag Berlin Heidelberg 🌐 English

This book covers several of the most important topics of current interest in the forefront of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors and atomic manipulation for future

Scanning Probe Microscopy

📁 Scanning Probe Microscopy

✍ Nikodem Tomczak, Kuan Eng Johnson Goh 📂 Library 📅 2010 🏛 World Scientific 🌐 English

Scanning Probe Microscopy (SPM) is the enabling tool for nano(bio)technology, which has opened new vistas in many interdisciplinary research areas. Concomitant with the developments in SPM instrumentation and techniques are new and previously unthought-of opportunities in materials nanofabrication a

Scanning Probe Microscopy: Atomic Force

📁 Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy

✍ Bert Voigtländer (auth.) 📂 Library 📅 2015 🏛 Springer-Verlag Berlin Heidelberg 🌐 English

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe te

Acoustic Scanning Probe Microscopy

📁 Acoustic Scanning Probe Microscopy

✍ D. Passeri, F. Marinello (auth.), Francesco Marinello, Daniele Passeri, Enrico S 📂 Library 📅 2013 🏛 Springer-Verlag Berlin Heidelberg 🌐 English

The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface adhesion and stiffness or friction is possible. The aim of this book is to provide a comprehensi

Scanning Probe Microscopy in Nanoscience

📁 Scanning Probe Microscopy in Nanoscience and Nanotechnology

✍ Hendrik Hölscher, Daniel Ebeling, Jan-Erik Schmutz, Marcus M. Schäefer (auth.), 📂 Library 📅 2010 🏛 Springer-Verlag Berlin Heidelberg 🌐 English

This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various

Scanning Probe Microscopy in Nanoscience

📁 Scanning Probe Microscopy in Nanoscience and Nanotechnology

✍ Hendrik Hölscher, Daniel Ebeling, Jan-Erik Schmutz, Marcus M. Schäefer (auth.), 📂 Library 📅 2010 🏛 Springer-Verlag Berlin Heidelberg 🌐 English

This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various