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Problems in reliability and maintainability (RAM) delivery systems

✍ Scribed by H. Reiche

Publisher: Elsevier Science
Year: 1979
Tongue: English
Weight: 107 KB
Volume: 19
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(79)90166-5

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## Abstract This article presents a method for predicting the downtime distribution for a new complex electronic equipment. A theoretical discussion is given which indicates that the downtime distribution for such an equipment can be represented by a lognormal function. Experimental data are shown