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Lognormal distribution and maintainability in support systems research

✍ Scribed by R. L. Bovaird; H. L. Zagor

Publisher
John Wiley and Sons
Year
1961
Tongue
English
Weight
835 KB
Volume
8
Category
Article
ISSN
0894-069X

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✦ Synopsis

Abstract

This article presents a method for predicting the downtime distribution for a new complex electronic equipment. A theoretical discussion is given which indicates that the downtime distribution for such an equipment can be represented by a lognormal function. Experimental data are shown which establish that the two‐parameter lognormal distribution function adequately describes the downtimes of a diverse group of electronic equipments. It is concluded that this analytical expression for the downtime distribution of complex electronic equipments provides the basis for a quantitative and scientific approach to the measurement and prediction of maintainability. This approach takes account of equipment maintenance characteristics and maintenance personnel capabilities.

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