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Probing the Spatial Distribution and Morphology of Supported Nanoparticles Using Rutherford-Scattered Electron Imaging

โœ Scribed by Paul A. Midgley; Matthew Weyland; John Meurig Thomas; Pratibha L. Gai; Edward D. Boyes


Publisher
John Wiley and Sons
Year
2002
Tongue
English
Weight
170 KB
Volume
114
Category
Article
ISSN
0044-8249

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Probing the Spatial Distribution and Mor
โœ Paul A. Midgley; Matthew Weyland; John Meurig Thomas; Pratibha L. Gai; Edward D. ๐Ÿ“‚ Article ๐Ÿ“… 2002 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 170 KB

We gratefully acknowledge the support (by a rolling grant to J.M.T. and joint grants to P.A.M. and J.M.T.) by the EPSRC (UK) and the Royal Commission for the Exhibition of 1851 for a Fellowship (to M.W.). Figure 1. Schematic diagram illustrating the geometry of detectors used for STEM BF, STEM HAADF