Probing the Spatial Distribution and Morphology of Supported Nanoparticles Using Rutherford-Scattered Electron Imaging

✍ Scribed by Paul A. Midgley; Matthew Weyland; John Meurig Thomas; Pratibha L. Gai; Edward D. Boyes

• Publisher: John Wiley and Sons
• Year: 2002
• Tongue: English
• Weight: 170 KB
• Volume: 41
• Category: Article
• ISSN: 0044-8249
• DOI: 10.1002/1521-3773(20021018)41:20<3804::aid-anie3804>3.0.co;2-g

✦ Synopsis

We gratefully acknowledge the support (by a rolling grant to J.M.T. and joint grants to P.A.M. and J.M.T.) by the EPSRC (UK) and the Royal Commission for the Exhibition of 1851 for a Fellowship (to M.W.). Figure 1. Schematic diagram illustrating the geometry of detectors used for STEM BF, STEM HAADF, and SEM BSE imaging.