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Probing of near surface semiconductor layers by electron energy loss spectroscopy

✍ Scribed by T.S. Jones; M.Q. Ding; N.V. Richardson; C.F. McConville; M.O. Schweitzer

Publisher: Elsevier Science
Year: 1990
Tongue: English
Weight: 521 KB
Volume: 54-55
Category: Article
ISSN: 0368-2048
DOI: 10.1016/0368-2048(90)80306-u

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