Probabilistic diagnosis of clustered faults for shared structures

✍ Scribed by Xiaojun Lu; Jianping Li; Chang-Jun Seo

• Publisher: Elsevier Science
• Year: 2009
• Tongue: English
• Weight: 848 KB
• Volume: 49
• Category: Article
• ISSN: 0895-7177
• DOI: 10.1016/j.mcm.2008.06.011

✦ Synopsis

The probabilistic diagnosis model is useful in many fields such as distributed network, digital system level testing and wafer fault testing. Some topologies and continuous defect units distributions are studied in our previous work. In this paper, we extend the model to arbitrary topology structure with share nodes and to the discrete defect distributions, such as Poission distribution and Binomial distribution. The results show high identification percentage of the nodes.