Probabilistic diagnosis of clustered fau
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Xiaojun Lu; Jianping Li; Chang-Jun Seo
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Article
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2009
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Elsevier Science
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English
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The probabilistic diagnosis model is useful in many fields such as distributed network, digital system level testing and wafer fault testing. Some topologies and continuous defect units distributions are studied in our previous work. In this paper, we extend the model to arbitrary topology structure