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Preparation, transmission electron microscopy, and microanalytical investigations of metal-III-V semiconductor interfaces

✍ Scribed by A. Klein; I. Urban; P. Ressel; E. Nebauer; U. Merkel; W. Österle

Book ID
114341055
Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
1020 KB
Volume
37
Category
Article
ISSN
1044-5803

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