Raman spectroscopic studies of PbxLa1−xT
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J.L. Zhu; W.L. Zhu; R.T. Li; W.Y. Ge; M. Jiang; J.G. Zhu; D.Q. Xiao; G. Pezzotti
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Article
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2008
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Elsevier Science
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English
⚖ 476 KB
A systematic spectroscopic investigation of Pb x La 1Àx Ti 1Àx/4 O 3 (PLT) thin films grown on PbO x /Pt/Ti/SiO 2 /Si substrate by RF magnetron sputtering was performed by using confocal Raman spectroscopy. Influence of the growth condition modification including different growth temperatures, with